OVERVIEW OF SPECIFIC QUALIFICATION TESTS OFFERED BY FERSHT INC:
Customer Focused Quality Service
Fersht Inc. is certified to provide qualification / integrity testing by leading electronic and photonic companies.
Our expertise comes from over 30 years of integrity testing and product design work.
12 years, Integrity testing and components development at JDS, 8 years Integrity testing at Alcatel Optronics and over
10 years at Fersht Inc.
(Please see the "Services" pages for additional details)
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Contact Fersht: 613-863-5973 E-mail Fersht Inc.
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Electronic and Fiber Optic components Qualification Testing and
Independent contract manufacturing QA screening : |
| Temperature cycle |
| Thermal shock |
| Moisture resistance, humidity / damp heat |
| Endurance life test. PC, HTSL, THB, HAST, Autoclave |
| High / low temperature storage. |
| Mechanical shock and Vibration testing. |
| Cyclic moisture test. |
| Corrosion Test. |
Flammability.
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| Salt spray. |
| Dust - Arizona fine dust test. |
| Immersion / Corrosion test. |
Fiber optic mechanical Integrity Testing: |
| Fiber twist test. |
| Fiber side-pull test. |
| Fiber straight-pull test. |
| Receptacle device durability test. |
| Mating durability test. |
| Wiggle test. |
| Transmission with applied load. |
| Epoxy testing, selection and consulting. |
CLIENT FEEDBACK:
See below few comments from customers (industry leaders in electronic and photonic field):
July-2006
(Photonic devices - US company)
Thank you for the fast response.
Your report was perfect and much appreciated.
Best regards,
Aug-2007
(Electronic boards testing in accelerated life test - EU company)
Fersht provided excellent service at affordable rates.
Your service and response was fast and your report was very professional.
Feb-2008
(JEDEC testing, microelectronics)
Excellent job, we will need your service again.
Thanks!
March-2008
(Fiber optic components- US/Canadian company)
I would like to thank you for the excellent work and the professionalism of your laboratory.
Jan-2009
I would like to thank you for your service.
I liked working with you.
July-2009
Many thanks for the prompt response and excellent work!!.
Your suggestion is very valuable and we will most probably abide by it.
Jan-2010
I would like to thank you again for your fast response, your work and the great service you provided at such a short notice.
I am happy we found your facility and we definitely will need more work very soon.
Oct-2010
Fersht is highly knowledgeable expert in the area of optical component reliability, failure analysis, and failure mitigation. It was immediately obvious to me that he had built up considerable expertise from his work with many industry-leading optical component companies. Not only did we benefit from his testing services, Joseph’s advice and suggestions were also very helpful and saved ........ Nov-2010
I am so happy we found you and run these test that reviled these problems with the foreign supplier.
It saved us embarrassment
Feb-2011
We got the parts back overnight.
Your prompt support helped us to provide the data we needed.
Our customer is happy.
Thanks
March-2011
We liked the way we could monitor the progress of the test/data
We definitely will need more tests.
Regards
July-2011
You helped us get the test rolling fast.
All our team would like to thank you for the quick response.
October-17-2011
Thank you for your great service on this project.
We got the parts late Saturday night and have completed the testing with good results.
A great relief for me and our project team.
Contact Fersht: 613-863-5973 E-mail Fersht Inc.
Examples of Accelerated test Requirements:
Accelerated aging (TC)
In addition to the temperature cycles to which optoelectronic devices are required to be subjected as part of the environmental stress tests, it can be useful to expose modules to a number of additional temperature cycles for “accelerated aging” purposes. Unlike the high-temperature accelerated aging tests, the primary purpose of the additional temperature cycles is generally not to cause
Gradual degradation of a particular performance parameter instead, it is to provide an additional demonstration of the long-term
Mechanical stability of the optical alignment within the module package.
Humidity
Although humidity acceleration factor models have been developed for some types of non-hermetic devices, at this time relatively little data exists on such issues as long-term diode degradation and optical coupling instabilities due to humidity.
Therefore, relatively long and severe tests are generally called for in this area, and the results may be primarily of use in the calculation of random failure rates instead of wear-out failure rates.

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